Nanometer Displacement Measurement Using High Magnification Diffraction Imaging.

Nanometer Displacement Measurement Using High Magnification Diffraction Imaging.

Author(s):

Publication title:

2005 SAE world congress : technical paper

Title of ser.:

Society of Automotive Engineers technical paper series

Ser. no.:

2005

Pub. Year:

2005

No.:

2005-01-0898

Paper no.:

2005-01-0898

Pages:

5

Pub. info.:

Warrendale, Penn.: Society of Automotive Engineers

ISSN:

01487191

Language:

English

Call no.:

S10400

Type:

Technical Paper

Details

TDL ID:	ZA00001678
Series ID:	PA00000058
Conf. info. (Name):	SAE World Congress, 2005
Conf. info. (Number):	2005
Conf. info. (Venue):	Detroit, MI, USA
Conf. info. (Date):	2005.04.11-2005.04.14
Note for article:	SAE World Congress, 2005, Detroit, MI, 11-14 April, 2005 ; Reprinted From: Experiments in Automotive Engineering - Optical Techniques, SP-1957

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