Prediction of Radiative Properties of Patterned Silicon Wafers by Solving Maxwell's Equatoins in the Time Domain.

Prediction of Radiative Properties of Patterned Silicon Wafers by Solving Maxwell's Equatoins in the Time Domain.

Author(s):

Publication title:

A.S.M.E. paper

Title of ser.:

ASME Technical Paper : HT

Ser. no.:

2003

Pub. Year:

2003

No.:

HT2003-47424

Paper no.:

HT2003-47424

Pages:

11

Pub. info.:

New York, NY: American Society of Mechanical Engineers

Language:

English

Call no.:

A11800

Type:

Technical Paper

Details

TDL ID:	ZA00001645
Series ID:	PA00000189
Conf. info. (Name):	ASME Summer Heat Transfer Conference
Conf. info. (Number):	2003
Conf. info. (Venue):	Las Vegas, Nevada, USA
Conf. info. (Date):	2003.07.21-2003.07.23
Note for article:	Summer Heat Transfer Conference, ASME, Las Vegas, NV, USA, 21-23 Jul. 2003

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