Effect of Processing Route on Strain Controlled Low Cycle Fatigue Behavior of Polycrystalline NiAl

Effect of Processing Route on Strain Controlled Low Cycle Fatigue Behavior of Polycrystalline NiAl

Author(s):

Rao, K. Bhanu Sankara ( NASA Lewis Research Center )
Lerch, B. A. ( NASA Lewis Research Center )
Noebe, R. D. ( NASA Lewis Research Center )

Publication title:

NASA Technical Reports

Pub. Year:

1995

Vol.:

19980018035

Issue:

NASA/TM-95-207392

Page(from):

1

Page(to):

30

Pages:

30

Pub. info.:

National Aeronautics and Space Adminstration

Language:

English

Type:

Technical Paper

Details

TDL ID:

ZA00001435

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