Electronic Structure of HgBa2CaCu2O(6+delta) Epitaxial films measured by x-ray Photoemission

Electronic Structure of HgBa2CaCu2O(6+delta) Epitaxial films measured by x-ray Photoemission

Author(s):

Vasquez, R. P. ( Jet Propulsion Lab. )
Rupp, M. ( IBM Watson Research Center )
Gupta, A. ( IBM Watson Research Center )
Tsuei, C. C. ( IBM Watson Research Center )

Publication title:

NASA Technical Reports

Pub. Year:

1995

Vol.:

19970009639

Issue:

NASA-CR-203122

Pt.:

NAS 1.26:203122

Page(from):

1

Page(to):

8

Pages:

8

Pub. info.:

National Aeronautics and Space Adminstration

Language:

English

Type:

Technical Paper

Details

TDL ID:

ZA00001434

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