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Impact of Carrier Lifetime Enhancement Using High Temperature Oxidation on 15 kV 4H-SiC P-GTO Thyristor

Author(s):
S.H. Ryu
D.J. Lichtenwalner
E. van Brunt
C. Capell
M.J. O'Loughlin
C. Jonas
Y. Lemma
J. Zhang
J. Richmond
A.A. Burk
B. Hull
H. O'Brien
A. Ogunniyi
A.J. Lelis
J. Casady
D. Grider
S. Allen
J.W. Palmour
13 more
Publication title:
Silicon Carbide and Related Materials 2016
Title of ser.:
Materials science forum
Ser. no.:
897
Pub. Year:
2017
Page(from):
587
Page(to):
590
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710434 [3035710430]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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