Increased Test Through Put on Dynamometers Through a System Approach to Noise and Vibration Testing

Increased Test Through Put on Dynamometers Through a System Approach to Noise and Vibration Testing

Author(s):

Publication title:

Proceedings of the 13th International Modal Analysis Conference : February 13-16, 1995, Sheraton Misic City Hotel, Nashville, Tennessee

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2460

Pub. Year:

1995

Pt.:

1

Page(from):

941

Page(to):

947

Pages:

7

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780912053486 [0912053488]

Language:

English

Call no.:

P63600/2460

Type:

Conference Proceedings

Details

TDL ID:	ZA00057662
Series ID:	PA00000029
Conf. info. (Name):	International Modal Analysis Conference
Conf. info. (Number):	13th
Conf. info. (Venue):	Nashville, TN, USA
Conf. info. (Date):	1995.02.13-1995.02.16
Note for article:	13th International Modal Analysis Conference, February 13-16, 1995, Nashville, TN, USA

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