Wavelet analysis for characterizing spatial heterogeneity in the subsurface

Wavelet analysis for characterizing spatial heterogeneity in the subsurface

Author(s):: B.-L. Li
Publication title:: Wavelet applications in signal and image processing III : 12-14 July 1995, Dan Diego, California
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 2569
Pub. Year:: 1995
Pt.:: 2
Page(from):: 736
Page(to):: 746
Pages:: 11
Pub. info.:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:: 0277786X
ISBN:: 9780819419286 [0819419281]
Language:: English
Call no.:: P63600/2569
Type:: Conference Proceedings

Details

TDL ID:	ZA00057770
Series ID:	PA00000029
Conf. info. (Name):	Symposium on wavelet applications in signal and image processing
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.12-1995.07.14
Note for article:	3rd Symposium on wavelet applications in signal and image processing, July 12-14, 1995, San Diego, CA, USA. 2569-67

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