Optimizing the performance of near-perfect defect detection machines

Optimizing the performance of near-perfect defect detection machines

Author(s):: W. Pölzleitner
Publication title:: Machine vision applications, architectures, and systems integration IV : 23-24 October, 1995, Philadelphia, Pennsylvania
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 2597
Pub. Year:: 1995
Page(from):: 178
Page(to):: 188
Pages:: 11
Pub. info.:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:: 0277786X
ISBN:: 9780819419613 [0819419613]
Language:: English
Call no.:: P63600/2597
Type:: Conference Proceedings

Details

TDL ID:	ZA00057793
Series ID:	PA00000029
Conf. info. (Name):	Symposium on machine vision applications, architectures, and systems integration
Conf. info. (Number):	4th
Conf. info. (Venue):	Philadelphia, PA, USA
Conf. info. (Date):	1995.10.23-1995.10.24
Note for article:	4th Symposium on machine vision applications, architectures, and systems integration, October 23-24, 1995, Philadelphia, PA, USA. 2597-24

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