Blank Cover Image

Hierarchical Markov random field models applied to image analysis: a review

Author(s):
Publication title:
Neural, morphological, and stochastic methods in image and signal processing : 10-11 July 1995 San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2568
Pub. Year:
1995
Page(from):
2
Page(to):
17
Pages:
16
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419279 [0819419273]
Language:
English
Call no.:
P63600/2568
Type:
Conference Proceedings

Similar Items:

J.-M. Laferté, F. Heitz, P. Pérez, E. Fabre

Society of Photo-optical Instrumentation Engineers

G.M. Budzban, T. Stirewalt

Society of Photo-optical Instrumentation Engineers

E. Mémin, P. Pérez

Society of Photo-optical Instrumentation Engineers

C. Wu, P.C. Doerschuk

Society of Photo-optical Instrumentation Engineers

Vargas-Voracek,R., Floyd,C.E.,Jr., Nolte,L.W., McAdams,P.

SPIE-The International Society for Optical Engineering

Tardif,P.-M., Zaccarin,A.

SPIE-The International Society for Optical Engineering

Devijver A. P., Dekesel M. M.

Springer-Verlag

Lett,C., Zerubia,J.

SPIE-The International Society for Optical Engineering

W. Xiong, C. Graffigne

Society of Photo-optical Instrumentation Engineers

Bratsolis, E., Sigelle, M.

SPIE - The International Society of Optical Engineering

Vargas-Voracek,R., Floyd,C.E.,Jr.

SPIE - The International Society for Optical Engineering

Mignotte,M., Collet,C., Perez,P., Bouthemy,P.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12