New process for the controlled formation of ultrathin PtSi films for infrared detector applications

New process for the controlled formation of ultrathin PtSi films for infrared detector applications

Author(s):

Publication title:

Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2554

Pub. Year:

1995

Page(from):

185

Page(to):

192

Pages:

8

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819419132 [0819419133]

Language:

English

Call no.:

P63600/2554

Type:

Conference Proceedings

Details

TDL ID:	ZA00057755
Series ID:	PA00000029
Conf. info. (Name):	Symposium on growth and characterization of materials for infrared detectors
Conf. info. (Number):	2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.13-1995.07.14
Note for article:	2nd Symposium on growth and characterization of materials for infrared detectors, July 13-14, 1995, San Diego, CA, USA. 2554-24

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