Negative electron affinity photocathodes as high-performance electron sources-Part 2: Energy spectrum measurements
- Author(s):
- Publication title:
- Photodetectors and power meters II : 11-12 July, 1995, San Diego, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2550
- Pub. Year:
- 1995
- Page(from):
- 189
- Page(to):
- 196
- Pages:
- 8
- Pub. info.:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819419095 [0819419095]
- Language:
- English
- Call no.:
- P63600/2550
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Negative electron affinity photocathodes as high-performance electron sources. Part 1: achievement of ultrahigh brightness from an NEA photocathode
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Performance limitations from Coulomb interaction in maskless parallel electron-beam lithography systems
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Transferred electron photocathode with greater than 20% quantum efficiency beyond 1 micron
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Modeling resist heating in mask fabrication using a multilayer Green's function approach
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Escape probability for negative electron affinity photocathodes: calculations compared to experiments
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Electron-bombarded back-illuminated CCD sensors for low-light-level imaging applications
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
High-speed mapping of intertransistor overlay variations using active electrical metrology
SPIE-The International Society for Optical Engineering |