Efforts to control the EUV reflectance degradation of sputtered SiC films
- Author(s):
- Publication title:
- Silicon carbide materials for optics and precision structures : 12-13 July 1995 San Diego, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2543
- Pub. Year:
- 1995
- Page(from):
- 254
- Page(to):
- 259
- Pages:
- 6
- Pub. info.:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819419026 [0819419028]
- Language:
- English
- Call no.:
- P63600/2543
- Type:
- Conference Proceedings
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