Development of optical noncontact sensor for measurement of 3D profiles using the depolarized component of backscattered light

Development of optical noncontact sensor for measurement of 3D profiles using the depolarized component of backscattered light

Author(s):

Publication title:

Optical manufacturing and testing : 9-11 July, 1995, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2536

Pub. Year:

1995

Page(from):

180

Page(to):

191

Pages:

12

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418951 [0819418951]

Language:

English

Call no.:

P63600/2536

Type:

Conference Proceedings

Details

TDL ID:	ZA00057737
Series ID:	PA00000029
Conf. info. (Name):	Symposium on optical manufacturing and testing
Conf. info. (Number):	1995
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.09-1995.07.11
Note for article:	1995 Symposium on optical manufacturing and testing, July 9-11, 1995, San Diego, CA, USA. 2536-22

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