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Resistivity and deep-level investigations of detector-grade CdTe: a comparison of different growth techniques

Author(s):
Publication title:
X-ray and ultraviolet sensors and applications : 13-14 July 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2519
Pub. Year:
1995
Page(from):
127
Page(to):
134
Pages:
8
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418784 [0819418781]
Language:
English
Call no.:
P63600/2519
Type:
Conference Proceedings

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