High-resolution position readout for proportional counters with fluorescence gating capability

High-resolution position readout for proportional counters with fluorescence gating capability

Author(s):

Publication title:

EUV, X-ray, and gamma-ray instrumentation for astronomy VI : 12-14 July 1995, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2518

Pub. Year:

1995

Page(from):

457

Page(to):

464

Pages:

8

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418777 [0819418773]

Language:

English

Call no.:

P63600/2518

Type:

Conference Proceedings

Details

TDL ID:	ZA00057720
Series ID:	PA00000029
Conf. info. (Name):	Symposium on EUV, X-ray, and gamma-ray instrumentation for astronomy
Conf. info. (Number):	6th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.12-1995.07.14
Note for article:	6th Symposium on EUV, X-ray, and gamma-ray instrumentation for astronomy, July 12-14, 1995, San Diego, CA, USA. 2518-34

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