Blank Cover Image

Performance of the large-area position-sensitive x-ray detector of the SAX wide-field camera

Author(s):
Publication title:
X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2517
Pub. Year:
1995
Page(from):
269
Page(to):
280
Pages:
12
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418760 [0819418765]
Language:
English
Call no.:
P63600/2517
Type:
Conference Proceedings

Similar Items:

R. Jager, J. Heise, W.A. Mels, A.C. Brinkman

Society of Photo-optical Instrumentation Engineers

Mels, W.A., Bruijn, M.P., Hoevers, H.F.C., Frericks, M., Kiewiet, F.B., Bento, A.C., Korte, P.A.J. de

SPIE

Caroli, E., Bertuccio, G., Cesare, G. De, Donati, A., Dusi, W., Landini, G., Perotti, F., Sampietro, M., Stephen, J. B.

MRS - Materials Research Society

Fortunato, E., Vieira, M., Ferreira, L., Carvalho, C.N., Lavareda, G., Martins, R.

Materials Research Society

Aguas, H. M. B., Brida, D., Cabrita, A., Ferreira, I. M. M., Fortunato, E. M. C., Giuliani, F., Maneira, M. J. P., …

Materials Research Society

Luhta,R., Rowlands,J.A.

SPIE-The International Society for Optical Engineering

Robberto, M., Baggett, S. M., Hilbert, B., MacKenty, J. W., Kimble, R. A., Hill, R. J., Cottingham, D. A., Delo, G., …

SPIE - The International Society of Optical Engineering

Robberto, M., Stiavelli, M., Baggett, S.M., Hilbert, B., MacKenty, J.W., Kimble, R.A., Hill, R.J., Cottingham, D.A., …

SPIE - The International Society of Optical Engineering

5 Conference Proceedings The Wide-Field Camera 3 detectors

S. M. Baggett, R. J. Hill, R. A. Kimble, J. W. MacKenty, A. Waczynski

Society of Photo-optical Instrumentation Engineers

Mazzinghi, P., Bratina, V., Tribilli, B.

SPIE-The International Society for Optical Engineering

Lin, B., Huang, M.Z., Shun, X.B., Cao, X.Q.

SPIE-The International Society for Optical Engineering

Naday,I., Sanishvili,R., Joachimiak,A., Westbrook,E.M., Jorden,A.R., Loeffen,P.W.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12