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Berkeley spectrometer for ORFEUS: laboratory and in-flight performance

Author(s):
Publication title:
X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2517
Pub. Year:
1995
Page(from):
116
Page(to):
125
Pages:
10
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418760 [0819418765]
Language:
English
Call no.:
P63600/2517
Type:
Conference Proceedings

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