Imaging photon counting system for the extreme ultraviolet(EUV)

Imaging photon counting system for the extreme ultraviolet(EUV)

Author(s):

Publication title:

X-ray and extreme ultraviolet optics : 9-11 July 1995, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2515

Pub. Year:

1995

Page(from):

220

Page(to):

230

Pages:

11

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418746 [0819418749]

Language:

English

Call no.:

P63600/2515

Type:

Conference Proceedings

Details

TDL ID:	ZA00057717
Series ID:	PA00000029
Conf. info. (Name):	Symposium on X-ray and extreme ultraviolet optics
Conf. info. (Number):	1995
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1995.07.09-1995.07.11
Note for article:	1995 Symposium on X-ray and extreme ultraviolet optics, July 9-11, 1995, San Diego, CA, USA. 2515-28

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