Comprehensive metrology-detection strategies for sub-0.5-µm lithography reticles
- Author(s):
- Publication title:
- Photomask and X-ray mask technology II : 20-21 April 1995, Kawasaki City, Kanagawa, Japan
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2512
- Pub. Year:
- 1995
- Page(from):
- 253
- Page(to):
- 262
- Pages:
- 10
- Pub. info.:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819418708 [0819418706]
- Language:
- English
- Call no.:
- P63600/2512
- Type:
- Conference Proceedings
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