Automated minimum resolvable temperature test implementation

Automated minimum resolvable temperature test implementation

Author(s):

Publication title:

Infrared imaging systems : design, analysis, modeling, and testing VI : 19-20 April 1995, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2470

Pub. Year:

1995

Page(from):

268

Page(to):

273

Pages:

6

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418234 [0819418234]

Language:

English

Call no.:

P63600/2470

Type:

Conference Proceedings

Details

TDL ID:	ZA00057672
Series ID:	PA00000029
Conf. info. (Name):	Symposium on infrared imaging systems
Conf. info. (Number):	1995
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1995.04.19-1995.04.20
Note for article:	1995 Symposium on infrared imaging systems, April 19-20, 1995, Orlando, FL, USA. 2470-26

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