Design, fabrication, and automated testing of 32-channel integrated MSM/MESFET optoelectronic integrated circuit (OEIC) receiver arrays

Design, fabrication, and automated testing of 32-channel integrated MSM/MESFET optoelectronic integrated circuit (OEIC) receiver arrays

Author(s):

Publication title:

Optoelectronic interconnects III : 8-9 February 1995, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2400

Pub. Year:

1995

Page(from):

296

Page(to):

299

Pages:

4

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819417473 [0819417475]

Language:

English

Call no.:

P63600/2400

Type:

Conference Proceedings

Details

TDL ID:	ZA00057603
Series ID:	PA00000029
Conf. info. (Name):	Symposium on optoelectronic interconnects
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1995.02.08-1995.02.09
Note for article:	3rd Symposium on optoelectronic interconnects, February 8-9, 1995, San Jose, CA, USA. 2400-33

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