Imaging microtubules in buffer solution using tapping mode atomic force microscopy

Imaging microtubules in buffer solution using tapping mode atomic force microscopy

Author(s):

Publication title:

Scanning probe microscopies III : 6-7 February 1995, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2384

Pub. Year:

1995

Page(from):

150

Page(to):

157

Pages:

8

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819417312 [0819417319]

Language:

English

Call no.:

P63600/2384

Type:

Conference Proceedings

Details

TDL ID:	ZA00057587
Series ID:	PA00000029
Conf. info. (Name):	Symposium on scanning probe microscopies
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1995.02.06-1995.02.07
Note for article:	3rd Symposium on scanning probe microscopies , February 6-7, 1995, San Jose, CA, USA. 2384-19

Similar Items:

1 Conference Proceedings Imaging adhesion forces on proteins with the atomic force microscope M. Radmacher, M. Fritz, M.W. Allersma, C.F. Schmidt, P.K. Hansma Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings Mapping site-specific endonuclease binding to DNA by direct imaging with atomic force microscopy (AFM) D.P. Allison, T.G. Thundat, P. Modrich, R.J. Isfort, M.J. Doktycz Society of Photo-optical Instrumentation Engineers
2 Conference Proceedings Atomic Scale Force Mapping with the Atomic Force Microscope Cleveland P. J., Radmacher M., Hansma K. P. Kluwer Academic Publishers	8 Conference Proceedings Atomic force microscope for small cantilevers Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Atomic force microscopy using small cantilevers Walters,D.A., Viani,M., Paloczi,G.T., Schaffer,T.E., Cleveland,J.P., Wendman,M.A., Gurley,G., Elings,V., Hansma,P.K. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Characterization of Interphase Regions Using Atomic Force Microscopy Vanlandingham, M. R., McKnight, S. H., Palmese, G. R., Bogetti, T. A., Eduljee, R. F., Gillespie, J. W., Jr. MRS - Materials Research Society
4 Conference Proceedings Realization and Observation of the Reversible and Irreversible Radial Deformation of Carbon Nanotubes by Tapping Mode Atomic Force Microscopy Yu, M., Ruoff, R.S., Kowalewski, I., Dyer, M.J., Von Ehr, J.R., Faircloth, B., Krchnavek, R.R. Electrochemical Society	10 Conference Proceedings Nucleation of Chromate Conversion Coating on Aluminum 2024-T3 Investigated by Atomic Force Microscopy Waldrop, J.R., Kendig, M.W. Electrochemical Society
5 Conference Proceedings 02-O-05 - Atomic force microscopy (AFM) used to relate surface topography growth mechanisms in SSZ-42 Anderson, M.W., Hanif, N., Agger, J.R., Chen, C.-Y., Zones, S.I. Elsevier	11 Conference Proceedings In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope Biro,L.P., Gyulai,J., Havancsak,K. Trans Tech Publications
6 Conference Proceedings Tapping Mode Atomic Force Microscopy Analysis of Electroless-Deposition Process Homma, T., Tanabe, M., Suzuki, M., Osaka, T. Electrochemical Society	12 Conference Proceedings ARTIFACTS IN ATOMIC FORCE MICROSCOPY OF NANOPOROUS AND MESOPOROUS FIDUCIAL SAMPLES Deckman, H.W., Plano, R.J. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12