Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle

Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle

Author(s):

Publication title:

Scanning probe microscopies III : 6-7 February 1995, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2384

Pub. Year:

1995

Page(from):

90

Page(to):

100

Pages:

11

Pub. info.:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819417312 [0819417319]

Language:

English

Call no.:

P63600/2384

Type:

Conference Proceedings

Details

TDL ID:	ZA00057587
Series ID:	PA00000029
Conf. info. (Name):	Symposium on scanning probe microscopies
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1995.02.06-1995.02.07
Note for article:	3rd Symposium on scanning probe microscopies , February 6-7, 1995, San Jose, CA, USA. 2384-10

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