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Application of scanning force microscopy and near-field optical microscopy to liquid crystalline systems: observing free surfaces, smectic structural forces, and molecular orientation

Author(s):
Publication title:
Scanning probe microscopies III : 6-7 February 1995, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2384
Pub. Year:
1995
Page(from):
60
Page(to):
70
Pages:
11
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819417312 [0819417319]
Language:
English
Call no.:
P63600/2384
Type:
Conference Proceedings

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