Blank Cover Image

Probing the forces between complementary strands of DNA with the atomic force microscope

Author(s):
Publication title:
Scanning probe microscopies III : 6-7 February 1995, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2384
Pub. Year:
1995
Page(from):
2
Page(to):
12
Pages:
11
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819417312 [0819417319]
Language:
English
Call no.:
P63600/2384
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Covalent attachment of a single dextran polymer between the tip of an atomic force microscope and a gold surface

Grandbois, M., Decor, R., Rief, M., Wagner, A., Mioskowski, C., Gaub, H.

MRS-Materials Research Society
7 Conference Proceedings Miniaturized atomic force microscope for planetary exploration

Gautsch, S., Staufer, U., Akiyama, T., de Rooij, N.F., Hidber, H.R., Tonin, A., Mueller, D., Howald, L., Niedermann, P.

ESA Publications Division
2 Conference Proceedings Fabrication of Grooves on Aluminum Surface with Atomic Force Microscope Probe Processing

Takahashi, H., Kato, Z., Sakairi, M.

Electrochemical Society
8 Conference Proceedings Unfolding Forces of Titin and Fibronectin Directly Measured by Single Molecule Force Spectroscopy

Rief, Matthias, Gaub, Hermann E.

American Chemical Society
3 Conference Proceedings Imaging adhesion forces on proteins with the atomic force microscope

M. Radmacher, M. Fritz, M.W. Allersma, C.F. Schmidt, P.K. Hansma

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings ATOMIC FORCE MICROSCOPE DESIGNS AND APPLICATIONS

Bryant, P.J., Miller, R.G., Deeken, R.H., Pederson, M.A.

Materials Research Society
4 Conference Proceedings Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E.G. Borgonjen, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings Atomic force microscope for small cantilevers

Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Design and fabrication of diamond probe for atomic force microscope

Shibata,T., Nakatsuji,T., Unno,K., Makino,E.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings Study of adhesive forces on a sillicon nanotip by atomic force microscope in contact mode

Agache, V., Legrand, B., Collard, D., Buchaillot, L.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Microfabrication of diamond probe for atomic force microscope

Shlbata,T., Nakatsuji,T., Kitamoto,Y., Unno,K., Makino,E.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Micro-manipulation using combined optical tweezers and atomic force microscope

H. Sehgal, T. De, S. Nettikadan, M. V. Salapaka

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12