Blank Cover Image

Light sectioning with improved depth resolution using a cylindrical lens to magnify the line deformation

Author(s):
Publication title:
Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2348
Pub. Year:
1995
Page(from):
227
Page(to):
238
Pages:
12
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819416834 [0819416835]
Language:
English
Call no.:
P63600/2348
Type:
Conference Proceedings

Similar Items:

J. Lewandowski, L. Desjardins

Society of Photo-optical Instrumentation Engineers

Gustafsson,M.G.L., Agard,D.A., Sedat,J.W.

SPIE-The International Society for Optical Engineering

Daley,R.C., Hassebrook,L.G.

SPIE-The International Society for Optical Engineering

Li, G., Hirano, K., Jiang, X., Chen, Z., Wu, Z., Ando, M., Pan, L., Tang, J., Zhu, P., Ning, R.

SPIE - The International Society of Optical Engineering

DesJardin, M. A., Doherty, S. J., Gilbert, J. R., LaPack, M. A.

American Institute of Chemical Engineers

Gu, B.-Y., Ye, J.-S., Dong, B.-Z.

SPIE-The International Society for Optical Engineering

Ding,Z., Ren, H., Zhao, Y., Nelson, J.S., Chen, Z.

SPIE-The International Society for Optical Engineering

Jang, J.-S., Javidi, B.

SPIE-The International Society for Optical Engineering

A. Rendon, J. Okawa, R. Weersink, J. C. Beck, L. Lilge

SPIE - The International Society of Optical Engineering

W. Zhang, H. Zhao, X. Zhou, L. Zhang

Society of Photo-optical Instrumentation Engineers

Mochan, W. L., Lopez-Bastidas, C., Maytorena, J. A., Mendoza, B. S., Brudny, V. L.

SPIE - The International Society of Optical Engineering

Javidi, B., Jang, J.-S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12