Blank Cover Image

Surface properties of holograms studied by atomic force microscopy

Author(s):
Publication title:
Fifth International Symposium on Display Holography : 18-22 July 1994, Lake Forest, Illinois
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2333
Pub. Year:
1995
Page(from):
49
Page(to):
52
Pages:
4
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819416667 [0819416665]
Language:
English
Call no.:
P63600/2333
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy

Sugawara, Y., Ueyama, H., Uchihashi, T., Ohta, M., Yanase, Y., Shigematsu, T., Suzuki, M., Morita, S.

MRS - Materials Research Society
7 Conference Proceedings STUDY OF SILICON SURFACE ROUGHNESS BY ATOMIC FORCE MICROSCOPY

Gilicinski, Andrew G., Rynders, Rebecca M., Beck, Scott E., Strausser, Yale E., Stets, James R., Felker, Brian S., …

MRS - Materials Research Society
2 Conference Proceedings Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy

Lindstrom,T., Isidorsson,J., Niklasson,G.A.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings NANOTRIBOLOGY OF DIAMOND FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

Neubauer, Gabi, Cohen, Sidney R., McClelland, Gary M.

Materials Research Society
3 Conference Proceedings Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy

Ogletree F. D., Hu J., Xiao D. X., Morant C., Dai Q., Vollmer R., Carpick R., Salmeron M.

Kluwer Academic Publishers
9 Conference Proceedings Effects of GaN Passivation With SiO2 and SiNx Studied by Photoluminescence and Surface Potential Electric Force Microscopy

Chevtchenko, S., Reshchikov, M. A., Zhu, K., Moon, Y. -T., Baski, A. A., Morkoc, H.

Materials Research Society
4 Conference Proceedings UV-patterned polymide surfaces: Characterization by Atomic Force Microscopy (AFM)

Blach, J.A., Watson, G.S., Brown, C.L., Suzuki, T., Myhra, S.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings GaN Surface ablation by femtosecond pulses:atomic force microscopy studies and accumulation effects

Eliseev,P.G., Juodkazis,S., Sugahara,T., Sun,H.-B., Matsuo,S., sakai,S., Misawa,H.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Wetting of Ultrathin Layers of Polystyrene Studied by Atomic Force Microscopy

Loi, S., Wind, M., Preuss, M., Butt, H.-J., Spiess, H.W., Jonas, U.

Elsevier
11 Conference Proceedings Characterization of Interphase Regions Using Atomic Force Microscopy

Vanlandingham, M. R., McKnight, S. H., Palmese, G. R., Bogetti, T. A., Eduljee, R. F., Gillespie, J. W., Jr.

MRS - Materials Research Society
6 Conference Proceedings Nanolithography of polymer surfaces by Atomic Force Microscopy

Blach, J.A., Watson, G.S., Brown, C.L., Pham, D.K., Wright, J.P., Nicolau, D.V., Myhra, S.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings ATOMIC FORCE MICROSCOPY OF POLYMER SURFACES

Unertl N. W., Jin X.

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12