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Detecting ionic currents in single channels using wavelet analysis, part I: zero mean Gaussian noise

Author(s):
Publication title:
Wavelet applications in signal and image processing II : 27-29 July 1994, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2303
Pub. Year:
1994
Page(from):
76
Page(to):
90
Pages:
15
Pub. info.:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819416278 [0819416274]
Language:
English
Call no.:
P63600/2303
Type:
Conference Proceedings

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