(4dy) Atom-by-Atom Metrology of Materials for Microelectronics, Energy and Biology
- Author(s):
- Publication title:
- 2010 AIChE annual meeting : conference proceedings : Salt Palace Convention Center, Salt Lake City, UT, November 7-12, 2010. Non-topical conferences
- Title of ser.:
- AIChE Conference Proceedings
- Ser. no.:
- P-264
- Pub. Year:
- 2010
- Pt.:
- Education
- Pub. info.:
- New York: American Institute of Chemical Engineers
- ISBN:
- 9780816910656 [0816910650]
- Language:
- English
- Call no.:
- A08000/2010 [CD-ROM]
- Type:
- Conference Proceedings
Similar Items:
|
American Institute of Chemical Engineers |
Materials Research Society |
|
American Institute of Chemical Engineers |
Materials Research Society |
|
3
Conference Proceedings
(263e) Shape- and Size-Controlled Fabrication of Lead Chalcogenide and Ferromagnetic Nanocrystals for Information Storage Devices
American Institute of Chemical Engineers |
9
Conference Proceedings
Behavior of Si Interstitials and Boron-Interstitial Pairs at the Si/SiO2 Interface
Materials Research Society |
|
American Institute of Chemical Engineers |
MRS - Materials Research Society |
|
American Institute of Chemical Engineers |
11
Conference Proceedings
Novel Materials from Agroproteins: Current and Potential Applications of Soy Protein Polymers
American Chemical Society |
|
6
Conference Proceedings
Evaluation of atomic force microscopy: comparison with electrical CD metrology and low-voltage scanning electron microscopy
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Materials compatibility and degradation problems in microelectronics (Abstract)
North-Holland |