Blank Cover Image

(486e) Wavelet Texture Analysis Based On Best Feature Selection for Texture Classification

Author(s):
Publication title:
Conference proceedings : 2009 AIChE annual meeting, Nashvikke, TN, November 8-13 : 09 AIChE annual meeting, Nashville, TN ; Non-topical conferences
Title of ser.:
AIChE Conference Proceedings
Ser. no.:
P-262
Pub. Year:
2009
Pt.:
10
Page(from):
160111
Pub. info.:
New York: American Institute of Chemical Engineers
ISBN:
9780816910586 [0816910588]
Language:
English
Call no.:
A08000/2009 [CD-ROM]
Type:
Conference Proceedings

Similar Items:

Pan, J., Gong, J., Lu, J., Ye, H., Chen, X., Yang, J.

SPIE - The International Society of Optical Engineering

YoungSub Lim, Eun-Seok Song, Youn-Woo Lee, Chonghun Han

American Institute of Chemical Engineers

Zheng,H.

SPIE-The International Society for Optical Engineering

Hong, J.-C., Kim, Y.Y.

SPIE-The International Society for Optical Engineering

Kim,M., Baek,J., Kim,S., Lee,G.

SPIE-The International Society for Optical Engineering

X. Xie, J. Lu, J. Gong, N. Zhang

Society of Photo-optical Instrumentation Engineers

Sheng,W., Xu,C., Liu,J.

SPIE-The International Society for Optical Engineering

Sun, Y., Long, Z., Jang, P. -R., Plodinec, M. J.

SPIE - The International Society of Optical Engineering

Hyunseok Chung, Sungwoo Cho, Daeyoun Kim, Hahyung Pyun, Chonghun Han

American Institute of Chemical Engineers

Baik, Sung Wook, Bala, Jerzy

SPIE

Thitimajshima,P.

SPIE - The International Society for Optical Engineering

Manian,V.B., Vega,A., Vasquez,R.E.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12