Characterization of Electron-Induced Defects in Cu (In, Ga) Se2 Thin Films by Photoluminescence

Characterization of Electron-Induced Defects in Cu (In, Ga) Se2 Thin Films by Photoluminescence

Author(s):

Publication title:

Recent Advances in Photovoltaics

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1771

Pub. Year:

2016

Page(from):

157

Page(to):

162

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781605117485 [160511748X]

Language:

English

Call no.:

M23500/1771

Type:

Conference Proceedings

Details

TDL ID:	ZA00055343
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meeting
Conf. info. (Number):	2015
Conf. info. (Venue):	San Francisco, California, USA
Conf. info. (Date):	2015.04.06-2015.04.10
Note for article:	2015 MRS Spring Meeting in San Francisco, California, April 6-10, 2015

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