Blank Cover Image

Improvement of SiO2/4H-SiC Interface Quality by Post-Oxidation Annealing in N2 at High-Temperatures

Author(s):
Publication title:
Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy
Title of ser.:
Materials science forum
Ser. no.:
858
Pub. Year:
2016
Page(from):
627
Page(to):
630
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710427 [3035710422]
Language:
English
Call no.:
M23650 [v.858]
Type:
Conference Proceedings

Similar Items:

A. Chanthaphan, Y. Katsu, T. Hosoi, T. Shimura, H. Watanabe

Trans Tech Publications

J.H. Moon, K.Y. Cheong, H.K. Song, J.H. Yim, M.S. Oh

Trans Tech Publications

A. Chanthaphan, T. Hosoi, Y. Nakano, T. Nakamura, T. Shimura

Trans Tech Publications

H. Watanabe, T. Hosoi, T. Kirino, Y. Uenishi, A. Chanthaphan

Trans Tech Publications

A. Chanthaphan, Y. Fukushima, K. Yamamoto, M. Aketa, H. Asahara

Trans Tech Publications

N. Soejima, T. Kimura, T. Ishikawa, T. Sugiyama

Trans Tech Publications

T. Hosoi, D. Nagai, M. Sometani, T. Shimura, M. Takei, H. Watanabe

Trans Tech Publications

T. Hosoi, Y. Kagei, T. Kirino, Y. Watanabe, K. Kozono

Trans Tech Publications

T. Hosoi, T. Kirino, A. Chanthaphan, Y. Uenishi, D. Ikeguchi

Trans Tech Publications

K. Król, M. Kalisz, M. Sochacki, J. Szmidt

Trans Tech Publications

T. Hosoi, M. Harada, Y. Kagei, Y. Watanabe, T. Shimura

Trans Tech Publications

T. Kimura, T. Ishikawa, N. Soejima, K. Nomura, T. Sugiyama

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12