Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

Structural and Magnetic Investigation of Cu, Co Substituted NiFe₂O₄ Thin Films by Scanning Probe Microscopy (AFM, MFM)

Author(s):

Publication title:

Advanced Materials and Manufacturing Processes for Strategic Sectors : Selected, peer reviewed papers from the International Conference on Advanced Materials and Manufacturing Processes for Strategic Sectors (ICAMPS 2015), May 13-15, 2015, Trivandrum, India

Title of ser.:

Materials science forum

Ser. no.:

830-831

Pub. Year:

2015

Page(from):

589

Page(to):

591

Pages:

3

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9783038355366 [3038355364]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054290
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Advanced Materials and Manufacturing Processes for Strategic Sectors (ICAMPS 2015)
Conf. info. (Number):	2015
Conf. info. (Venue):	Trivandrum, India
Conf. info. (Date):	2015.05.13-2015.05.15
Note for article:	International Conference on Advanced Materials and Manufacturing Processes for Strategic Sectors (ICAMPS 2015), May 13-15, 2015, Trivandrum, India

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