Blank Cover Image

VF Degradation of 4H-SiC PiN Diodes Using Low-BPD Wafers

Author(s):
Publication title:
Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan
Title of ser.:
Materials science forum
Ser. no.:
778-780
Pub. Year:
2014
Pt.:
2
Page(from):
851
Page(to):
854
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Doping Concentration Optimization for Ultra-Low-Loss 4H-SiC Floating Junction Schottky Barrier Diode (Super-SBD)

C. Ota, J. Nishio, K. Takao, T. Hatakeyama, T. Shinohe

Trans Tech Publications
7 Conference Proceedings Process and Device Simulation of a SiC Floating Junction Schottky Barrier Diode (Super-SBD)

Hatakeyama, T., Nishio, J., Shinohe, T.

Trans Tech Publications
2 Conference Proceedings Fabrication of 4H-SiC Floating Junction Schottky Barrier Diodes (Super-SBDs) and their Electrical Properties

Ota, C., Nishio, J., Hatakeyama, T., Shinohe, T., Kojima, K., Nishizawa, S., Ohashi, H.

Trans Tech Publications
8 Conference Proceedings Reliability of 4H-SiC(000-1) MOS Gate Oxide Using N2O Nitridation

T. Suzuki, J. Senzaki, T. Hatakeyama, K. Fukuda, T. Shinohe

Trans Tech Publications
3 Conference Proceedings Simulation, Fabrication and Characterization of 4H-SiC Floating Junction Schottky Barrier Diodes (Super-SBDs)

C. Ota, J. Nishio, T. Hatakeyama, T. Shinohe, K. Kojima, S.I. Nishizawa, H. Ohashi

Trans Tech Publications
9 Conference Proceedings Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P.O.A., Jacobson, H., Molina-Aldareguia, J.M., Bergman, J.P., Tuomi, T., Clegg, W.J., Janzen, E., Hultman, L.

Trans Tech Publications
4 Conference Proceedings Epitaxial Overgrowth of 4H-SiC for Devices with p-Buried Floating Junction Structure

Nishio, J., Ota, C., Shinohe, T., Kojima, K., Okumura, H.

Trans Tech Publications
10 Conference Proceedings Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P.O.A., Jacobson, H., Molina-Aldareguia, J.M., Bergman, J.P., Tuomi, T., Clegg, W.J., Janzen, E., Hultman, L.

Trans Tech Publications
5 Conference Proceedings Optimization of a SiC Super-SBD Based on Scaling Properties of Power Devices

Hatakeyama, T., Ota, C., Nishio, J., Shinohe, T.

Trans Tech Publications
11 Conference Proceedings Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

Jacobson, H., Bergman, J.P., Hallin, C., Tuomi, T., Janzen, E.

Trans Tech Publications
6 Conference Proceedings SiC Device Limitation Breakthrough with Novel Floating Junction Structure on 4H-SiC

Adachi, K., Omura, I., Ono, R., Nishio, J., Shinohe, T., Ohashi, H., Arai, K.

Trans Tech Publications
12 Conference Proceedings Homo-Epitaxial Growth on 2° Off-Cut 4H-SiC(0001) Si-Face Substrates Using H2-SiH4-C3H8 CVD System

K. Tamura, C. Kudou, K. Masumoto, J. Nishio, K. Kojima

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12