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Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space

Author(s):
Publication title:
International Conference on Residual Stresses 9 (ICRS 9) : Selected, peer reviewed papers from the 9th International Conference on Residual Stresses (ICRS 9), October 7-9, 2012, Garmisch-Partenkirchen, Germany
Title of ser.:
Materials science forum
Ser. no.:
768-769
Pub. Year:
2014
Page(from):
44
Page(to):
51
Pages:
8
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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