Blank Cover Image

A New Deformation Region and How Low Do You Go? - “Intrinsic Deformation Limit”

Author(s):
Publication title:
High Performance Structure Materials : Selected, peer reviewed papers from the Chinese Materials Congress 2012 (CMC 2012), July 13-18, 2012, Taiyuan, China
Title of ser.:
Materials science forum
Ser. no.:
747-748
Pub. Year:
2013
Page(from):
559
Page(to):
563
Pages:
5
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Academic Journal Primary-transient creep and anelastic backflow of pure copper deformed at low temperatures and ultra-low strain rates

Jun-jie SHEN, Ken-ichi IKEDA, Satoshi HATA, Hideharu NAKASHIMA

Editorial Office of Trans. NFsoc., Central-South University of Technology
7 Conference Proceedings Technological Features in the New Mole Penetrator “KRET”

J. Grygorczuk, K. Seweryn, R. Wawrzaszek, M. Banaszkiewicz

ESA Communication Production Office
2 Conference Proceedings Assessment on the Interaction of Radiation, Convective Heating, and Ablation for the “RadFlight” Re-Entry Flight Experiment

J.J. Na, C. Park, K.S. Chang, J. Muylaert

ESA Communication Production Office
8 Conference Proceedings Short-Term Creep Behavior in P91 Heat-Resistant Steel at Low Stress

P.S. Zhao, J.J. Shen, H. Zhang

Trans Tech Publications
3 Conference Proceedings Low-k1 imaging: how low can we go?

Finders,J., Eurlings,M., Schenau,K.Van Ingen, Dusa,M.V., Jenkins,P.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings How do we evaluate the cost of health care technology?

J.J. Nobel

Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings (703a) Single-Cell Analysis of Quality Control in S. Cerevisiae: How ‘Low’' Can You Go?

Carissa L. Young, Theresa Yuraszeck, David Raden, Jeffrey Caplan, Francis J. Doyle III

American Institute of Chemical Engineers
10 Conference Proceedings Mechanical Characterization of “Blister” Defects on Optical Oxide Multilayers Using Nanoindentation

K. Mehrotra, H.P. Howard, S.D. Jacobs, J.C. Lambropoulos

Materials Research Society
5 Conference Proceedings Grain Boundary Structures of ARB Processed Aluminum

S. Ii, M. Hishida, N. Takata, K. Ikeda, H. Nakashima

Trans Tech Publications
11 Conference Proceedings Templated Synthesis of Enzyme Mimics: How Far Can We Go?

Anderson S., Sanders M. K. J.

Kluwer Academic Publishers
6 Conference Proceedings The flash memory battle: How low can we go?

E. van Setten, O. Wismans, K. Grim, J. Finders, M. Dusa

Society of Photo-optical Instrumentation Engineers
12 Conference Proceedings (535g) Single-Cell Analysis of Cellular Quality Control In S. Cerevisiae: How ‘Low’ Can You Go?

Carissa L. Young, Theresa Yuraszeck, Jeffrey Caplan, Kirk J. Czymmek, Francis J. Doyle III

American Institute of Chemical Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12