Application of Scanning Confocal Electron Microscopy to Nanomaterials and the Improvement in Resolution by Image Processing

Application of Scanning Confocal Electron Microscopy to Nanomaterials and the Improvement in Resolution by Image Processing

Author(s):

Publication title:

Advanced material science and technology : selected, peer reviewed papers from the 7th International Forum on Advanced Material Science and Technology, June 26-28, 2011, Dalian, China (IFAMST-7)

Title of ser.:

Materials science forum

Ser. no.:

675-677

Pub. Year:

2011

Pt.:

1

Page(from):

259

Page(to):

262

Pages:

4

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054175
Series ID:	PA00000012
Conf. info. (Name):	International Forum on Advanced Material Science and Technology
Conf. info. (Number):	7th
Conf. info. (Venue):	Dalian, China
Conf. info. (Date):	2011.06.26-2011.06.28
Note for article:	7th International Forum on Advanced Material Science and Technology, June 26-28, 2011, Dalian, China (IFAMST-7)

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