Blank Cover Image

Evolution of Basal Plane Dislocations during 4H-SiC Epitaxial Growth

Author(s):
Publication title:
Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007
Title of ser.:
Materials science forum
Ser. no.:
600-603
Pub. Year:
2009
Pt.:
1
Page(from):
317
Page(to):
320
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

R.L. Myers-Ward, K.K. Lew, B.L. VanMil, R.E. Stahlbush, K.X. Liu

Trans Tech Publications

P.B. Klein, R.L. Myers-Ward, K.K. Lew, B.L. VanMil, C.R. Eddy Jr.

Trans Tech Publications

R.L. Myers-Ward, B.L. VanMil, R.E. Stahlbush, S.L. Katz, J.M. McCrate

Trans Tech Publications

K.X. Liu, X. Zhang, R.E. Stahlbush, M. Skowronski, J.D. Caldwell

Trans Tech Publications

B.L. Vanmil, R.E. Stahlbush, R.L. Myers-Ward, Y.N. Picard, S.A. Kitt

Trans Tech Publications

K.K. Lew, B.L. Van Mil, R.L. Myers-Ward, R.T. Holm, C.R. Eddy Jr., D.K. Gaskill

Trans Tech Publications

R.E. Stahlbush, R.L. Myers-Ward, B.L. VanMil, D.K. Gaskill, C.R. Eddy Jr.

Trans Tech Publications

R.E. Stahlbush, K.X. Liu, Q. Zhang, J.J. Sumakeris

Trans Tech Publications

V.D. Wheeler, B.L. VanMil, R.L. Myers-Ward, S. Chung, Y.N. Picard

Trans Tech Publications

11 Conference Proceedings Microhardness of 6H- and 4H-SiC Substrates

C.R. Eddy Jr., P. Wu, I. Zwieback, B.L. VanMil, R.L. Myers-Ward

Trans Tech Publications

B.L. Van Mil, K.K. Lew, R.L. Myers-Ward, R.T. Holm, D.K. Gaskill, C.R. Eddy Jr

Trans Tech Publications

D.K. Gaskill, M.A. Mastro, K.K. Lew, B.L. Van Mil, R.L. Myers-Ward, R.T. Holm, C.R. Eddy Jr

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12