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Detailed Photocurrent Analysis of Iron Contaminated Boron Doped Silicon by Comparison of Simulation and Measurement

Author(s):
Publication title:
Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) (plus Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes)
Title of ser.:
ECS transactions
Ser. no.:
10(1)
Pub. Year:
2007
Page(from):
117
Page(to):
126
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781604238259 [1604238259]
Language:
English
Call no.:
E23400/10-1
Type:
Conference Proceedings

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