Blank Cover Image

Quality Disturbance Recognition Based on the Generalized-S Transform

Author(s):
Publication title:
Computer-aided design, manufacturing, modeling and simulation II : selected, peer reviewed papers from the 2nd International Conference on Computer-Aided Design, Manufacturing, Modeling and Simulation (CDMMS 2012), Chongqing, China, 21-23 September 2012
Title of ser.:
Applied mechanics and materials
Ser. no.:
246-247
Pub. Year:
2013
Vol.:
1
Page(from):
251
Page(to):
256
Pages:
6
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
16609336
ISBN:
9781622767939 [1622767934]
Language:
English
Call no.:
A69500/246
Type:
Conference Proceedings

Similar Items:

Wang, Bin, Wang, Xi, Liu, Yue

Trans Tech Publications

Liu, L., Shen, S., Liu, Q.

SPIE - The International Society of Optical Engineering

Liu, Yue, He, Ai, Wang, Bin, Wang, Xi

Trans Tech Publications

Liu, Yue, Tan, Dao Liang, Wang, Bin, Wang, Xi

Trans Tech Publications

LI, Jian Cheng, Xi, Tao, Wang, Bo

Trans Tech Publications

Wang,N., Liu,L., Wang,B., Yin,Y., Yan,X.

SPIE-The International Society for Optical Engineering

H. Wang

Society of Photo-optical Instrumentation Engineers

Ding, G., Liu, L.

SPIE - The International Society of Optical Engineering

Wang,X., Ding,X., Liu,C.

SPIE-The International Society for Optical Engineering

S. Liu, H. Wang

Society of Photo-optical Instrumentation Engineers

Easley, G.R., Colonna, F.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12