The Defect Classification of TFT-LCD Array Photolithography Process via Using Back-Propagation Neural Network
- Author(s):
- Publication title:
- Applied mechanics, materials and manufacturing : selected, peer reviewed papers from the 2013 International Conference on Applied Mechanics, Materials, and Manufacturing (AMMM 2013) : Hong Kong, China 17-18 August 2013
- Title of ser.:
- Applied mechanics and materials
- Ser. no.:
- 378
- Pub. Year:
- 2014
- Page(from):
- 340
- Page(to):
- 345
- Pages:
- 6
- Pub. info.:
- Stafa-Zuerich: Trans Tech Publications
- ISSN:
- 16609336
- ISBN:
- 9781629936437 [162993643X]
- Language:
- English
- Call no.:
- A69500/378
- Type:
- Conference Proceedings
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