Review of Characterization of ZnO by Spectroscopic Ellipsometry

Review of Characterization of ZnO by Spectroscopic Ellipsometry

Author(s):

Publication title:

ZnO based thin films, nano-wires, and nano-belts for photonic and electronic devices and sensors

Title of ser.:

ECS transactions

Ser. no.:

16(12)

Pub. Year:

2008

Page(from):

33

Page(to):

40

Pages:

8

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

19385862

ISBN:

9781566776585 [1566776589]

Language:

English

Call no.:

E23400/16-12

Type:

Conference Proceedings

Details

TDL ID:	ZA00047175
Series ID:	PA00000034
Conf. info. (Name):	Symposium on ZnO based Thin Films, Nano-Wires, and Nano-Belts for Photonic and Electronic Devices and Sensors ; PRiME Meeting
Conf. info. (Number):	2008 ; 2008
Conf. info. (Venue):	Honoulu, Hawaii, USA
Conf. info. (Date):	2008.10.12-2008.10.17
Note for article:	Symposium on ZnO based Thin Films, Nano-Wires, and Nano-Belts for Photonic and Electronic Devices and Sensors, during the PRiME 2008 meeting, held in Honoulu, Hawaii, from October 12 to1 7, 2008

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