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MSTAR: an absolute metrology sensor with sub-micron accuracy for space-based applications

Author(s):
Publication title:
Proceedings of the 5th International Conference on Space Optics : 30 March-2 April 2004, Toulouse, France
Title of ser.:
ESA SP
Ser. no.:
554
Pub. Year:
2004
Pages:
8
Pub. info.:
Noordwijk, The Netherlands: ESA Publications Division
ISSN:
1609042X
ISBN:
9789290928652 [9290928654]
Language:
English
Call no.:
E11690/554
Type:
Conference Proceedings

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