External Contamination Observed on the Micro-Particles Capturer and Space Environment Exposure Device

External Contamination Observed on the Micro-Particles Capturer and Space Environment Exposure Device

Author(s):

Publication title:

Proceedings of the 10th ISMSE, 8th ICPMSE, 19-23 June 2006, Collioure, France

Title of ser.:

ESA SP

Ser. no.:

616

Pub. Year:

2006

Pages:

6

Pub. info.:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

1609042X

ISBN:

9789290929277 [9290929278]

Language:

English

Call no.:

E11690/616

Type:

Conference Proceedings

Details

TDL ID:	ZA00049596
Series ID:	PA00000009
Conf. info. (Name):	International Symposium on Materials in a Space Environment (ISMSE) : International Conference on Protection of Materials and Structures in a Space Environment (ICPMSE)
Conf. info. (Number):	10th : 8th
Conf. info. (Venue):	Collioure, France
Conf. info. (Date):	2006.06.19-2006.06.23
Note for article:	10th International Symposium on Materials in a Space Environment & 8th International Conference on Protection of Materials and Structures in a Space Environment, 19–23 June 2006, Collioure, France. S5 Contamination

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