On-Wafer Wideband Characterization: from Technology Improvements to Compact Models for Advanced MOS Devices

On-Wafer Wideband Characterization: from Technology Improvements to Compact Models for Advanced MOS Devices

Author(s):

Publication title:

Proceedings of the Microwave Technology and Techniques Workshop - enabling future space systems, 15-16 May 2006, ESTEC, Noordwijk, the Netherlands

Title of ser.:

ESA SP

Ser. no.:

632

Pub. Year:

2006

Pages:

7

Pub. info.:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

1609042X

ISBN:

9789290929437 [929092943X]

Language:

English

Call no.:

E11690/632

Type:

Conference Proceedings

Details

TDL ID:	ZA00049609
Series ID:	PA00000009
Conf. info. (Name):	Microwave Technology and Techniques Workshop
Conf. info. (Number):	2006
Conf. info. (Venue):	Noordwijk, The Netherlands
Conf. info. (Date):	2006.05.15-2006.05.16
Note for article:	Microwave Technology and Techniques Workshop, 15–16 May 2006, Noordwijk, The Netherlands - Poster Papers

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