High Accuracy Absolute Long Distance Metrology using Femto-Second Lasers: Optical Frequency Combs and Spectral Interference Techniques

High Accuracy Absolute Long Distance Metrology using Femto-Second Lasers: Optical Frequency Combs and Spectral Interference Techniques

Author(s):

Publication title:

The 3rd International Symposium on Formation Flying Missions and Technologies : 23-25 April 2008, ESA-ESTEC, Noordwijk, The Netherlands

Title of ser.:

ESA SP

Ser. no.:

654

Pub. Year:

2008

Pages:

9

Pub. info.:

Noordwijk, The Netherlands: ESA Communications

ISSN:

1609042X

ISBN:

9789292212186 [9292212184]

Language:

English

Call no.:

E11690/654

Type:

Conference Proceedings

Details

TDL ID:	ZA00052891
Series ID:	PA00000009
Conf. info. (Name):	International Symposium on Formation Flying, Missions and Technologies
Conf. info. (Number):	3rd
Conf. info. (Venue):	Noordwijk, The Netherlands
Conf. info. (Date):	2008.04.23-2008.04.25
Note for article:	The 3rd International Symposium on Formation Flying, Missions and Technologies, 23–25 April 2008, Noordwijk, The Netherlands - Technologies and Design of Distributed Sensors Needing Formation Flying

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