Review and comparison of shearography and active thermography for nondestructive testing and evaluation (NDT&E)

Author(s):

• Y. S. Chen ( City Univ. of Hong Kong, Hong Kong, China )
• Y. Y. Hung ( City Univ. of Hong Kong, Hong Kong, China )
• S. P. Ng ( City Univ. of Hong Kong, Hong Kong, China )
• Y. H. Huang ( City Univ. of Hong Kong, Hong Kong, China )
• L. Liu ( City Univ. of Hong Kong, Hong Kong, China )

Publication title:

ICEM 2008 : International Conference on Experimental Mechanics 2008, 8-11 November 2008, Nanjing, China , editors ; Xiaoyuan He, Huimin Xie, Yilan Kang ; organized by the Chinese Society for Experimental Mechanics [and] Southeast University (China) ; sponsored by Asian Committee of Experimental Mechanics [and] the Chinese Society of Theoretical and Applied Mechanics ; cosponsored by Ministry of Education of China ... [et al.] ; cooperating organization, SPIE.

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7375

Pub. Year:

2009

Vol.:

2

Page(from):

73754W-1

Page(to):

73754W-6

Pages:

6

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819476517 [081947651X]

Language:

English

Call no.:

P63600/7375

Type:

Conference Proceedings