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Study on bi-color phase measurement deflectometry

Author(s):
  • Y. Liu ( Sichuan Univ., China )
  • X. Su ( Sichuan Univ., China )
  • Q. Zhang ( Sichuan Univ., China )
Publication title:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7283
Pub. Year:
2009
Vol.:
2
Page(from):
728349-1
Page(to):
728349-4
Pages:
4
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475435 [0819475432]
Language:
English
Call no.:
P63600/7283
Type:
Conference Proceedings

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