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Image denoising based on wavelet transform

Author(s):
Y. Ha ( Hebei Univ., China )  
Publication title:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7283
Pub. Year:
2009
Vol.:
2
Page(from):
728348-1
Page(to):
728348-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475435 [0819475432]
Language:
English
Call no.:
P63600/7283
Type:
Conference Proceedings

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