Laser-induced damage threshold detection for optical thin films and research on damage morphology
- Author(s):
- Publication title:
- 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7283
- Pub. Year:
- 2009
- Vol.:
- 1
- Page(from):
- 72831Z-1
- Page(to):
- 72831Z-6
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819475435 [0819475432]
- Language:
- English
- Call no.:
- P63600/7283
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
The effects of ion cleaning on the roughness of substrates and laser-induced damage thresholds of films
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Threshold distribution determination of laser-induced damage precursors in optical coatings and substrates
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Influence of electric field distribution on laser induced damage threshold and morphology of high reflectance optical coatings
Society of Photo-optical Instrumentation Engineers |
4
Conference Proceedings
Process optimization of DLC films by unbalanced magnetron sputtering for laser-induced damage threshold improvement
Society of Photo-optical Instrumentation Engineers |
10
Conference Proceedings
Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Optical and morphological properties induced by laser in oxotitanium phthalocynine thin film
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
12
Conference Proceedings
Damage morphologies and causes of laser-induced damage of thin oxide films at 248 nm
Society of Photo-optical Instrumentation Engineers |